Table of Contents

Description

The Ion Beam Etcher has a collimated monochromatic broad-beam ion source (Kaufman type) that can be used for ion etching / ion milling. The beam diameter is 4 cm. Working pressure is 3-4 e-4 mbar. The maximum beam current is 10 mA and the maximum energy is 1500 eV. For resist processing typically low energies are used to avoid damage to the imaging resist.

The system is equipped with a loadlock with a knudsen cell so that a deposition step can be performed immediately after etching (a so called self aligned process). The substrate table can be tilted and can rotate in the tilt plane.

Manual Ion beam etcher

Change the input source on the display to DisplayPort if it isn't on the correct input source.
Switch over USB cables of mouse and keyboard.

Mounting sample on holder

Insert sample

Pumping down

Etching

When done

Pressure gauges

Pressure control unit: Leybold and Hereaus Combivac CM33.
The pressure control unit will switch automatically between the different pressure sensors.

DM (Capacitance gauge, 1000 to 10 mbar): Leybold CM1000
TM (Pirani gauge , 10 to 10e-3 mbar): Thermovac TR 216 Leybold
PM (Penning gauge , 10e-3 to 10e-8 mbar): Penningvac PR36

Etching rates

Material Date User Etched Thickness Etching time Recipe Gas Rate
Al 20080708 Jorina 20 nm 360 sec 10 Ar, 3.0e-4 mbar 0.056 nm/sec
Al 20151007 Timothy 9.9 nm 180 sec 10 Ar, 3.0e-4 mbar 0.055 nm/sec
Au 20090518 Christianne 90 nm 110 sec 10 Ar, 3.0e-4 mbar 0.820 nm/sec
Au 20111206 Boltje 19.7 nm 30 sec 10 Ar, 4.0e-4 mbar 0.660 nm/sec
Au 20120404 Boltje 12.6 nm 30 sec 10 Ar, 3.0e-4 mbar 0.420 nm/sec
Co 20110105 Boltje 22.3 nm 150 sec 10 Ar, 3.2 e-4 mbar 0.149 nm/sec
Co 20111207 Boltje 33.6 nm 168 sec 10 Ar, 4.0 e-4 mbar 0.200 nm/sec
Co 20120404 Boltje 7.4 nm 30 sec 10 Ar, 3.0 e-4 mbar 0.247 nm/sec
Cu 20110112 Boltje 41.8 nm 70 sec 10 Ar, 3.2 e-4 mbar 0.597 nm/sec
Cu 20111206 Boltje 23.1 nm 42 sec 10 Ar, 4.0 e-4 mbar 0.550 nm/sec
Cu 20120404 Boltje 9.3 nm 30 sec 10 Ar, 3.0 e-4 mbar 0.310 nm/sec
LCMO(L401) 20060621 Christianne 40.7 nm 230 sec 10 Ar, 2.5e-4 mbar 0.313 nm/sec
LCMO(L558) 20091002 Christianne 20 nm 240 sec 9 Ar, 2.5e-4 mbar 0.083 nm/sec
LCMO(L566)20090520 Christianne 10 nm 30 sec 10 Ar, 3.0 e-4 mbar 0.330 nm/sec
MoGe 20120403 Boltje 3.5 nm 30 sec 10 Ar, 3.0e-4 mbar 0.117 nm/sec
Nb 20050311 Chris 50 nm 232 sec 10 Ar, 2.5e-4 mbar 0.215 nm/sec
Nb 20101409 Laurens 100nm 1080 sec 10 Ar, 3.2 e-4 mbar 0.093 nm/sec
Nb 20121114 Stefano 18.8 nm 200 sec 10 Ar, 3.2 e-4 mbar 0.094 nm/sec
Nb 20140926 Boltje 28.3 nm 420 sec 10 Ar, 2.9 e-4 mbar 0.067 nm/sec
NbN 20050215 Olaf 51.3 nm 352 sec 10 Ar, 2.5e-4 mbar 0.146 nm/sec
Ni 20110117 Boltje 15.6 nm 80 sec 10 Ar, 3.2 e-4 mbar 0.195 nm/sec
Py 20130603 Boltje 19.2 nm 120 sec 10 Ar, 3.9 e-4 mbar 0.160 nm/sec
Py 20131120 Henk 32.4 nm 150 sec 10 Ar, 3.0 e-4 mbar 0.216 nm/sec

Nb 20050311 based on 7:30 sputtering in UHV, 220 mA, 4 ubar, 0 angle, 258 A Xtal

Deposition rates

Material Date User Process parameters Measurement Time Result Rate Notes
SiO2 20120907 Boltje 1090 oC X-ray 15 min 15 nm 1 nm/min
SiO2 20140321 Boltje 1090 oC X-ray 30 min 140 nm 4.67 nm/min

Miscellaneous

ibe-logbook.xls